標題: | Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor |
作者: | Tai, Ya-Hsiang Huang, Shih-Che Su, Ko-Ching Tseng, Chen-Yeh 顯示科技研究所 Institute of Display |
關鍵字: | charge sensitive amplifier;poly-Si TFTs;X-ray active matrix sensor |
公開日期: | 1-May-2008 |
摘要: | The application of the capability of low-temperature poly-Si TFT circuits for high resolution X-ray active matrix sensor is explored. The integration of poly-Si TIFT circuits oil the glass enables an easy connection for the sensor array with fine pixel pitch. A novel charge sensitive amplifier circuit employing poly-Si TFTs is proposed for the readout system of the active matrix sensor. It can considerably increase the circuit's immunity to the unavoidable threshold voltage variations of the poly-Si TFTs.. The V-TH mismatch effect of the TFTs, which results in the offset voltage of the charge amplifier, can also be suppressed by the proposed circuit. However, the noise arisen from the V-TH mismatch can be even larger than that from the V-TH variation after compensation. It reflects that, for higher bit digital X-ray image sensors, the mismatch effect of the devices must be properly taken into consideration. (c) 2007 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.sse.2007.12.005 http://hdl.handle.net/11536/9428 |
ISSN: | 0038-1101 |
DOI: | 10.1016/j.sse.2007.12.005 |
期刊: | SOLID-STATE ELECTRONICS |
Volume: | 52 |
Issue: | 5 |
起始頁: | 649 |
結束頁: | 656 |
Appears in Collections: | Articles |
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