應用良率分析於生產不同積體電路產品之生產線製造績效評估之研究

標題:	應用良率分析於生產不同積體電路產品之生產線製造績效評估之研究 Application of Yield Analysis on Manufacturing Performance Evaluation of Integrated Circuits Production Lines
作者:	唐麗英 TONG LEE-ING 交通大學工業工程與管理系
關鍵字:	積體電路;良率分析;績效評估;修正卜松模式;Integrated circuit (IC);Yield analysis;Performance evaluation;Modified Poisson model
公開日期:	1999
官方說明文件#:	NSC88-2213-E009-033
URI:	http://hdl.handle.net/11536/94708 https://www.grb.gov.tw/search/planDetail?id=460934&docId=84442
Appears in Collections:	Research Plans

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