Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 李崇仁 | en_US |
| dc.date.accessioned | 2014-12-13T10:37:38Z | - |
| dc.date.available | 2014-12-13T10:37:38Z | - |
| dc.date.issued | 1998 | en_US |
| dc.identifier.govdoc | NSC87-2512-S009-003-EE | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/94781 | - |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=334775&docId=59356 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 超大型積體電路測試 | zh_TW |
| dc.subject | 自動測試機 | zh_TW |
| dc.subject | 課程發展 | zh_TW |
| dc.subject | VLSI testing | en_US |
| dc.subject | Automatic testing equipment | en_US |
| dc.subject | Curriculum development | en_US |
| dc.title | 超大型積體電路測試與可測性設計課程發展---子計畫六：自動測試應用(III) | zh_TW |
| dc.title | "VLSI Testing and Design for Testability" Course Development: Automatic Test Application (III) | en_US |
| dc.type | Plan | en_US |
| dc.contributor.department | 交通大學電子工程系 | zh_TW |
| Appears in Collections: | Research Plans | |
