| Title: | 超大型積體電路測試與可測性設計課程發展---子計畫六：自動測試應用(III) "VLSI Testing and Design for Testability" Course Development: Automatic Test Application (III) |
| Authors: | 李崇仁 交通大學電子工程系 |
| Keywords: | 超大型積體電路測試;自動測試機;課程發展;VLSI testing;Automatic testing equipment;Curriculum development |
| Issue Date: | 1998 |
| Gov't Doc #: | NSC87-2512-S009-003-EE |
| URI: | http://hdl.handle.net/11536/94781 https://www.grb.gov.tw/search/planDetail?id=334775&docId=59356 |
| Appears in Collections: | Research Plans |
