| 標題: | A novel poly-Si nanowire TFT for nonvolatile memory applications |
| 作者: | Hsu, Hsin-Hwei Lin, Horng-Chih Huang, Jian-Fu Huang, Tiao-Yuan 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 2008 |
| 摘要: | A novel ploy-Si nanowire TFT-SONOS device configured with independent double-gate structure was fabricated and characterized. The electrical characteristics including programming and erasing properties were studied. Adding an adequate top-gate bias was found to improve the programming efficiency, resulting in larger memory window. |
| URI: | http://hdl.handle.net/11536/952 |
| ISBN: | 978-1-4244-1656-1 |
| 期刊: | MTTD 2007 TAIPEI: PROCEEDINGS OF 2007 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN, AND TESTING (MTD '07) |
| 起始頁: | 55 |
| 結束頁: | 56 |
| 顯示於類別: | 會議論文 |

