Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 李崇仁 | en_US |
| dc.date.accessioned | 2014-12-13T10:39:29Z | - |
| dc.date.available | 2014-12-13T10:39:29Z | - |
| dc.date.issued | 1995 | en_US |
| dc.identifier.govdoc | NSC84-2514-S009-002 | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/96528 | - |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=173143&docId=29494 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.language.iso | zh_TW | en_US |
| dc.title | 「超大型積體電路測試與可測試性設計」課程發展---總計畫 | zh_TW |
| dc.title | "Visi Testing and Design for Testability"Course Development | en_US |
| dc.type | Plan | en_US |
| dc.contributor.department | 國立交通大學電子工程學系 | zh_TW |
| Appears in Collections: | Research Plans | |
