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Showing results 21 to 28 of 28 < previous 
Issue DateTitleAuthor(s)
1-Jan-2010Nonlinear Behavior Characterization of RF Active Devices Using Impedance-dependence X-parametersChiu, Chia-Sung; Lin, Shu-Yu; Chen, Bo-Yuan; Chen, Kun-Ming; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2013Performance Improvement in RF LDMOS Transistors Using Wider Drain ContactChen, Kun-Ming; Chen, Bo-Yuan; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Chun-Hao; Lin, Horng-Chih; Huang, Tiao-Yuan; Chen, Ming-Yi; Yang, Yu-Chi; Jaw, Brenda; Wang, Kai-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Power Improvement for 65nm nMOSFET with High-Tensile CESL and Fast Nonlinear Behavior ModelingChiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Lin, Shu-Yu; Chen, Bo-Yuan; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2012Random Telegraph Noise in 1X-nm CMOS Silicide Contacts and a Method to Extract Trap DensityChen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Ho, Chia-Hua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2017RF power FinFET transistors with a wide drain-extended finChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Hsiu-Chih; Chen, Chun-Chi; Hsueh, Fu-Kuo; Chen, Min-Cheng; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
2011Silicide Barrier Engineering Induced Random Telegraph Noise in 1Xnm CMOS ContactsChen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Huang, Chien-Chao; Ho, ChiaHua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2020Study of Charge Trapping Effects on AlGaN/GaN HEMTs Under UV Illumination With Pulsed I-V MeasurementNagarajan, Venkatesan; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Chuang, Chia-Wei; Lin, Chuang-Ju; Anandan, Deepak; Wu, Chai-Hsun; Han, Ping-Cheng; Singh, Sankalp Kumar; Tien-Tung Luong; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; 國際半導體學院; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-Sep-2010Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 21 to 28 of 28 < previous