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公開日期標題作者
1-四月-2012LDMOS Transistor High-Frequency Performance Enhancements by StrainChen, Kun-Ming; Huang, Guo-Wei; Chen, Bo-Yuan; Chiu, Chia-Sung; Hsiao, Chih-Hua; Liao, Wen-Shiang; Chen, Ming-Yi; Yang, Yu-Chi; Wang, Kai-Li; Liu, Chee Wee; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2020Low-Frequency Noise Characterization of AlGaN & x002F;GaN HEMTs and MIS-HEMTs Under UV IlluminationNagarajan, Venkatesan; Chen, Kun-Ming; Lin, Hsin-Yi; Hu, Hsin-Hui; Huang, Guo-Wei; Lin, Chuang-Ju; Chen, Bo-Yuan; Anandan, Deepak; Singh, Sankalp Kumar; Wu, Chai-Hsun; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-十一月-2012Low-Operating-Voltage Ultrathin Junctionless Poly-Si Thin-Film Transistor Technology for RF ApplicationsTsai, Tzu-I; Chen, Kun-Ming; Lin, Horng-Chih; Lin, Ting-Yao; Su, Chun-Jung; Chao, Tien-Sheng; Huang, Tiao-Yuan; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-一月-2018A Miniature 92-95 GHz On-chip Slow-wave Branch-line CouplerChen, Yi-Tang; Chiu, Chia-Sung; Chuang, Chia-Wei; Chen, Kun-Ming; Huang, Guo-Wei; Peng, Sheng-Kai; Ke, Yu-Ting; We, Lin-Kun; 電信工程研究所; Institute of Communications Engineering
1-一月-2019Monolithic 3D SRAM-CIM Macro Fabricated with BEOL Gate-All-Around MOSFETsHsueh, Fu-Kuo; Lee, Chun-Ying; Xue, Cheng-Xin; Shen, Chang-Hong; Shieh, Jia-Min; Chen, Bo-Yuan; Chiu, Yen-Cheng; Chen, Hsiu-Chih; Kao, Ming-Hsuan; Huang, Wen-Hsien; Li, Kai-Shin; Wu, Chien-Ting; Lin, Kun-Lin; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Meng-Fan; Hu, Chenming; Yeh, Wen-Kuan; 交大名義發表; National Chiao Tung University
1-一月-2010Nonlinear Behavior Characterization of RF Active Devices Using Impedance-dependence X-parametersChiu, Chia-Sung; Lin, Shu-Yu; Chen, Bo-Yuan; Chen, Kun-Ming; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2007On the RF extrinsic resistance extraction for partially-depleted SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2013Performance Improvement in RF LDMOS Transistors Using Wider Drain ContactChen, Kun-Ming; Chen, Bo-Yuan; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Chun-Hao; Lin, Horng-Chih; Huang, Tiao-Yuan; Chen, Ming-Yi; Yang, Yu-Chi; Jaw, Brenda; Wang, Kai-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Power Improvement for 65nm nMOSFET with High-Tensile CESL and Fast Nonlinear Behavior ModelingChiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Lin, Shu-Yu; Chen, Bo-Yuan; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2009Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal-Oxide-Semiconductor Field-Effect TransistorsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006RF extrinsic resistance extraction considering neutral-body effect for partially-depleted SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding MethodChen, Kun-Ming; Chen, Han-Yu; Huang, Guo-Wei; Liao, Wen-Shiang; Chang, Chun-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2017RF power FinFET transistors with a wide drain-extended finChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Hsiu-Chih; Chen, Chun-Chi; Hsueh, Fu-Kuo; Chen, Min-Cheng; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-五月-2019A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effectsNagarajan, Venkatesan; Chen, Kun-Ming; Wang, Huan-Chung; Singh, Sankalp Kumar; Anandan, Deepak; Lin, Yueh-Chin; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-九月-2006Small-signal modeling of SiGeHBTs using direct parameter-extraction methodChen, Han-Yu; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Chun-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1995STUDIES OF SI╱SIGE HETEROJUNCTION BIPOLAR TRANSISTORS陳坤明; Chen, Kun-Ming; 張俊彥; Zhang, Zun-Yan; 電子研究所
1-六月-2020Study of Charge Trapping Effects on AlGaN/GaN HEMTs Under UV Illumination With Pulsed I-V MeasurementNagarajan, Venkatesan; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Chuang, Chia-Wei; Lin, Chuang-Ju; Anandan, Deepak; Wu, Chai-Hsun; Han, Ping-Cheng; Singh, Sankalp Kumar; Tien-Tung Luong; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; 國際半導體學院; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-八月-2008Temperature dependence of high frequency noise behaviors for RF MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Temperature Dependences of RF Small-Signal Characteristics for the SOI Dynamic Threshold Voltage MOSFETWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2009Temperature Effect on Ku-Band Current-Reused Common-Gate LNA in 0.13-mu m CMOS TechnologyChen, Wen-Lin; Chang, Sheng-Fuh; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Jen-Chung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics