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國立陽明交通大學機構典藏
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公開日期
標題
作者
1-一月-2014
Evaluation of Read-and Write-Assist Circuits for GeOI FinFET 6T SRAM Cells
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Su, Pin
;
Chuang, Ching-Te
;
電機工程學系
;
Department of Electrical and Computer Engineering
1-十二月-2014
Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits
Chen, Yin-Nien
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電機學院
;
College of Electrical and Computer Engineering
2010
Evaluation of Static Noise Margin and Performance of 6T FinFET SRAM Cells with Asymmetric Gate to Source/Drain Underlap Devices
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2014
Evaluation of Sub-0.2 V High-Speed Low-Power Circuits Using Hetero-Channel MOSFET and Tunneling FET Devices
Chen, Yin-Nien
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2015
Evaluation of TFET and FinFET Devices and 32-Bit CLA Circuits Considering Work Function Variation and Line-Edge Roughness
Chen, Chien-Ju
;
Chen, Yin-Nien
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2013
Evaluation of Transient Voltage Collapse Write-Assist for GeOI and SOI FinFET SRAM Cells
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2010
FinFET SRAM Cell Optimization Considering Temporal Variability due to NBTI/PBTI and Surface Orientation
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Hsieh, Chien-Yu
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-三月-2011
FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate Dielectrics
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Hsieh, Chien-Yu
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-七月-2012
Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs
Yu, Chang-Hung
;
Wu, Yu-Sheng
;
Hu, Vita Pi-Ho
;
Su, Pin
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2011
Impact of Quantum Confinement on Short-Channel Effects for Ultrathin-Body Germanium-on-Insulator MOSFETs
Wu, Yu-Sheng
;
Hsieh, Hsin-Yuan
;
Hu, Vita Pi-Ho
;
Su, Pin
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-三月-2012
Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs
Yu, Chang-Hung
;
Wu, Yu-Sheng
;
Hu, Vita Pi-Ho
;
Su, Pin
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2015
Impacts of NBTI and PBTI on Ultra-Thin-Body GeOI 6T SRAM Cells
Hu, Vita Pi-Ho
;
Fan, Ming-Long
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2012
Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic Circuits
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Chen, Yin-Nien
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2011
Impacts of Single Trap Induced Random Telegraph Noise on FinFET Devices and SRAM Cell Stability
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Chen, Yin-Nien
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2013
Impacts of Single Trap Induced Random Telegraph Noise on Si and Ge Nanowire FETs, 6T SRAM Cells and Logic Circuits
Yang, Shao-Yu
;
Chen, Yin-Nien
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2014
Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and Logic Circuits
Chen, Chien-Ju
;
Chen, Yin-Nien
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2010
Independently-Controlled-Gate FinFET Schmitt Trigger Sub-threshold SRAMs
Hsieh, Chien-Yu
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-七月-2012
Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs
Hsieh, Chien-Yu
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
Chuang, Ching-Te
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2014
Investigation and Optimization of Monolithic 3D Logic Circuits and SRAM Cells Considering Interlayer Coupling
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Chen, Yin-Nien
;
Su, Pin
;
Chuang, Ching-Te
;
電機工程學系
;
Department of Electrical and Computer Engineering
五月-2015
Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET
Hsu, Chih-Wei
;
Fan, Ming-Long
;
Hu, Vita Pi-Ho
;
Su, Pin
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics