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公開日期標題作者
1-一月-2014Evaluation of Read-and Write-Assist Circuits for GeOI FinFET 6T SRAM CellsHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電機工程學系; Department of Electrical and Computer Engineering
1-十二月-2014Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist CircuitsChen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電機學院; College of Electrical and Computer Engineering
2010Evaluation of Static Noise Margin and Performance of 6T FinFET SRAM Cells with Asymmetric Gate to Source/Drain Underlap DevicesHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2014Evaluation of Sub-0.2 V High-Speed Low-Power Circuits Using Hetero-Channel MOSFET and Tunneling FET DevicesChen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Evaluation of TFET and FinFET Devices and 32-Bit CLA Circuits Considering Work Function Variation and Line-Edge RoughnessChen, Chien-Ju; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2013Evaluation of Transient Voltage Collapse Write-Assist for GeOI and SOI FinFET SRAM CellsHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010FinFET SRAM Cell Optimization Considering Temporal Variability due to NBTI/PBTI and Surface OrientationHu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate DielectricsHu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2012Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETsYu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2011Impact of Quantum Confinement on Short-Channel Effects for Ultrathin-Body Germanium-on-Insulator MOSFETsWu, Yu-Sheng; Hsieh, Hsin-Yuan; Hu, Vita Pi-Ho; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2012Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETsYu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Impacts of NBTI and PBTI on Ultra-Thin-Body GeOI 6T SRAM CellsHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic CircuitsFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011Impacts of Single Trap Induced Random Telegraph Noise on FinFET Devices and SRAM Cell StabilityFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Impacts of Single Trap Induced Random Telegraph Noise on Si and Ge Nanowire FETs, 6T SRAM Cells and Logic CircuitsYang, Shao-Yu; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and Logic CircuitsChen, Chien-Ju; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Independently-Controlled-Gate FinFET Schmitt Trigger Sub-threshold SRAMsHsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2012Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMsHsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2014Investigation and Optimization of Monolithic 3D Logic Circuits and SRAM Cells Considering Interlayer CouplingFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電機工程學系; Department of Electrical and Computer Engineering
五月-2015Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FETHsu, Chih-Wei; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics