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公開日期標題作者
1-十月-1998New type of liquid refractometerSu, DC; Lee, JY; Chiu, MH; 光電工程學系; Department of Photonics
1-五月-1997Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometryChiu, MH; Lee, JY; Su, DC; 光電工程研究所; Institute of EO Enginerring
1-五月-1997Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometryChiu, MH; Lee, JY; Su, DC; 交大名義發表; 光電工程學系; National Chiao Tung University; Department of Photonics
1-十二月-2004RHEED in-situ monitored step edge diffusion during interrupted laser ablation epitaxy growth of SrTiO3Wang, TC; Lee, JY; Hsieh, CC; Juang, JY; Wu, KH; Uen, TM; Gou, YS; 電子物理學系; Department of Electrophysics
1-七月-2000RHEED intensity oscillations in homoepitaxial growth of SrTiO3 filmsLee, JY; Juang, JY; Ou, JH; Chen, YF; Wu, KH; Uen, TM; Gou, YS; 電子物理學系; Department of Electrophysics
1-三月-1998A similarity method for miniature mobile robotsLiu, TS; Lee, JY; 機械工程學系; Department of Mechanical Engineering
20-三月-2000Temperature dependence of RHEED oscillation in homoepitaxial growth of SrTiO3(100) films on stepped substratesLee, JY; Juang, JY; Wu, KH; Uen, TM; Gou, YS; 電子物理學系; Department of Electrophysics
22-十一月-2005Thickness and optical constants measurement of thin film growth with circular heterodyne interferometryHsu, CC; Lee, JY; Su, DC; 光電工程學系; Department of Photonics
1-十二月-1998Thin-film properties and barrier effectiveness of chemically vapor deposited amorphous WSix filmWang, MT; Lin, YC; Lee, JY; Wang, CC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-1999Vacuum measurement using total-internal-reflection heterodyne interferometryChiu, MH; Lee, JY; Su, DC; Lee, KH; 光電工程學系; Department of Photonics
15-十月-2002X-ray scattering study of crystallization behavior in homoepitaxial growth of SrTiO3 filmsLee, HY; Chang, WD; Hsu, CH; Liang, KS; Lee, JY; Juang, JY; Wu, KH; Uen, TM; Gou, YS; 電子物理學系; Department of Electrophysics