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公開日期標題作者
1-一月-2018Resistive Switching Non-volatile Memory Feasible for 28nm and Beyond Embedded Logic CMOS TechnologyChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015The RTN Measurement Technique on Leakage Path Finding in Advanced High-k Metal Gate CMOS DevicesHsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; Yew, T. R.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008The State-of-the-Art Mobility Enhancing Schemes for High-Performance Logic CMOS TechnologiesChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Technology roadmaps on the ballistic transport in strain engineered nanoscale CMOS devicesChung, Steve S.; Tsai, Y. J.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-五月-2016A theoretical and experimental evaluation of surface roughness variation in trigate metal oxide semiconductor field effect transistorsHsieh, E. R.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2016The Understanding of Breakdown Path in Both High-k Metal-Gate CMOS and Resistance RAM by the RTN MeasurementChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2019The Understanding of Gate Capacitance Matching on Achieving a High Performance NC MOSFET with Sufficient MobilityChiang, C. K.; Husan, P.; Lou, Y. C.; Li, F. L.; Hsieh, E. R.; Liu, C. H.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism FoundHsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and BeyondLin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN TrapsHsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
19-五月-2014The understanding of the drain-current fluctuation in a silicon-carbon source-drain strained n-channel metal-oxide-semiconductor field-effect transistorsHsieh, E. R.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006Understanding of the leakage components and its correlation to the oxide scaling on the SONOS cell endurance and retentionChen, C. H.; Chiang, P. Y.; Chung, Steve S.; Chen, Terry; Chou, George C. W.; Chu, C. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
14-十二月-2015The understanding on the evolution of stress-induced gate leakage in high-k dielectric metal-oxide-field-effect transistor by random-telegraph-noise measurementHsieh, E. R.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013U型多重讀寫氮化矽快閃式記憶體之耐久性及資料保存探討王漢樽; Wang, Han-Tsun; 莊紹勳; Chung, Steve S.; 電子工程學系 電子研究所
2013The Variability Issues in Small Scale Trigate CMOS Devices: Random Dopant and Trap Induced FluctuationsChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2017一種新穎的鰭式電晶體可程式神經陣列 在人工神經網路的應用陳泓文; 莊紹勳; Chen, Hung-Wen; Chung, Steve S.; 電子研究所
2009二氧化鉿薄膜電阻式隨機存取記憶體之轉換機制及可靠度探討王振鵬; Wang, Jen-Peng; 莊紹勳; Chung, Steve S.; 電子研究所
2013二氧化鉿電阻式記憶體之探討與隨機電報雜訊分析陳敬翰; Chen, Ching-Han; 莊紹勳; Chung, Steve S.; 電子工程學系 電子研究所
2012二氧化鉿電阻式記憶體多位元操作之隨機電報雜訊分析黃英傑; Huang, Ying-Jie; 莊紹勳; Chung, Steve S.; 電子研究所
2013二氧化鉿高介電層之N通道金氧半電晶體氧化層缺陷研究伍邦齊; Wu, Pang-Chi; 莊紹勳; Chung, Steve S.; 電子工程學系 電子研究所
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