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Showing results 1 to 12 of 12
Issue DateTitleAuthor(s)
15-Jan-2002Addenda to photoluminescence and electron paramagnetic resonance studies of defect centers in porous siliconLue, HT; Tseng, CY; Lue, JT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Nov-2001Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin filmsLue, HT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2002Device modeling of ferroelectric memory field-effect transistor (FeMFET)Lue, HT; Wu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2003Device Modeling of ferroelectric memory field-effect transistor for the application of ferroelectric random access memoryLue, HT; Wu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2-Dec-2002Effects of nitridation of silicon and repeated spike heating on the electrical properties of SrTiO3 gate dielectricsLiu, CY; Lue, HT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2000Fermi and anti-Fermi glass transition and subband resonant quantum tunneling in Nb/Ti metallic multilayer filmsLue, JT; Liang, SY; Lee, YW; Lue, HT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2002An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectricLue, HT; Liu, CY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2004Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin filmsHuang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Apr-2002A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurementLue, HT; Tseng, TY; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2002Microwave penetration depth measurement for high T-c superconductors by dielectric resonatorsLue, HT; Lue, JT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurementLue, HT; Tseng, TY; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Jun-2000Photoluminescence and electron paramagnetic resonance studies of defect centers in porous siliconLue, HT; Huang, BY; Lue, JT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 12 of 12