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Browsing by Author Yen, Cheng-Cheng

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Issue DateTitleAuthor(s)
1-Jun-2009The Effect of IEC-Like Fast Transients on RC-Triggered ESD Power ClampsYen, Cheng-Cheng; Ker, Ming-Dou; 電機學院; College of Electrical and Computer Engineering
2007Failure of on-chip power-fall ESD clamp circuits during system-level ESD testYen, Cheng-Cheng; Ker, Ming-Dou; 電機學院; College of Electrical and Computer Engineering
1-Nov-2008Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD TestKer, Ming-Dou; Yen, Cheng-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Latchup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD testKer, Ming-Dou; Yen, Cheng-Cheng; 電機學院; College of Electrical and Computer Engineering
1-Feb-2012New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display PanelsKer, Ming-Dou; Yen, Cheng-Cheng; 電機學院; College of Electrical and Computer Engineering
1-Oct-2010New Transient Detection Circuit for On-Chip Protection Design Against System-Level Electrical-Transient DisturbanceKer, Ming-Dou; Yen, Cheng-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008New transient detection circuit for system-level ESD protectionYen, Cheng-Cheng; Liao, Chi-Sheng; Ker, Ming-Dou; 電機學院; College of Electrical and Computer Engineering
2011On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbanceYen, Cheng-Cheng; Ker, Ming-Dou; Lin, Wan-Yen; Yang, Che-Ming; Chen, Shih-Fan; Chen, Tung-Yang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006On-chip transient detection circuit for system-level ESD protection in CMOS ICsKer, Ming-Dou; Yen, Cheng-Cheng; Shih, Pi-Chia; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2008On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulationKer, Ming-Dou; Yen, Cheng-Cheng; Shih, Pi-Chia; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2-Apr-2009POWER-RAIL ESD PROTECTION CIRCUIT WITHOUT LOCK-ON FAILUREKer, Ming-Dou; Yen, Cheng-Cheng; Chen, Tung-Yang
1-Jan-2010Protection Design Against System-Level ESD Transient Disturbance on Display PanelsKer, Ming-Dou; Lin, Wan-Yen; Yen, Cheng-Cheng; Yang, Che-Ming; Chen, Tung-Yang; Chen, Shih-Fan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2014SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbanceKer, Ming-Dou; Lin, Wan-Yen; Yen, Cheng-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006System-level ESD protection design with on-chip transient detection circuitYen, Cheng-Cheng; Ker, Ming-Dou; Shih, Pi-Chia; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
29-Oct-2009TRANSIENT DETECTION CIRCUITKer, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang
23-Jul-2009TRANSIENT DETECTION CIRCUIT FOR ESD PROTECTIONKer, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang
2008Transient Detection Circuit for System-Level ESD Protection and Its On-Board Behavior with EMI/EMC FiltersKer, Ming-Dou; Liao, Chi-Sheng; Yen, Cheng-Cheng; 電機學院; College of Electrical and Computer Engineering
17-Sep-2009TRANSIENT TO DIGITAL CONVERTERSKer, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang
1-Jun-2009Transient-Induced Latchup in CMOS ICs Under Electrical Fast-Transient TestYen, Cheng-Cheng; Ker, Ming-Dou; Chen, Tung-Yang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Transient-induced latchup in CMOS integrated circuits due to electrical fast transient (EFT) testYen, Cheng-Cheng; Ker, Ming-Dou; 電機學院; College of Electrical and Computer Engineering
Showing results 1 to 20 of 25  next >