標題: | On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulation |
作者: | Ker, Ming-Dou Yen, Cheng-Cheng Shih, Pi-Chia 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | electrical transient detection;electrostatic discharge (ESD);system-level ESD test;transient noise |
公開日期: | 1-二月-2008 |
摘要: | A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance to detect different positive and negative fast electrical transients has been investigated by the HSPICE simulator and verified in a silicon chip. The experimental results in a 0.13-mu m CMOS integrated circuit (IC) have confirmed that the proposed on-chip transient detection circuit can be used to detect fast electrical transients during the system-level ESD events. The proposed transient detection circuit can be further combined with the power-on reset circuit to improve the immunity of the CMOS IC products against system-level ESD stress. |
URI: | http://dx.doi.org/10.1109/TEMC.2007.911911 http://hdl.handle.net/11536/9696 |
ISSN: | 0018-9375 |
DOI: | 10.1109/TEMC.2007.911911 |
期刊: | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY |
Volume: | 50 |
Issue: | 1 |
起始頁: | 13 |
結束頁: | 21 |
顯示於類別: | 期刊論文 |