標題: On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulation
作者: Ker, Ming-Dou
Yen, Cheng-Cheng
Shih, Pi-Chia
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: electrical transient detection;electrostatic discharge (ESD);system-level ESD test;transient noise
公開日期: 1-二月-2008
摘要: A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance to detect different positive and negative fast electrical transients has been investigated by the HSPICE simulator and verified in a silicon chip. The experimental results in a 0.13-mu m CMOS integrated circuit (IC) have confirmed that the proposed on-chip transient detection circuit can be used to detect fast electrical transients during the system-level ESD events. The proposed transient detection circuit can be further combined with the power-on reset circuit to improve the immunity of the CMOS IC products against system-level ESD stress.
URI: http://dx.doi.org/10.1109/TEMC.2007.911911
http://hdl.handle.net/11536/9696
ISSN: 0018-9375
DOI: 10.1109/TEMC.2007.911911
期刊: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume: 50
Issue: 1
起始頁: 13
結束頁: 21
顯示於類別:期刊論文


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