標題: On-chip Transient Detection Circuit for Microelectronic Systems against Electrical Transient Disturbances due to ESD Events
作者: Chen, Wen-Chieh
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: electromagnetic compatibility (EMC);electrostatic discharge (ESD);system-level ESD;transient detection circuit
公開日期: 1-一月-2018
摘要: A new on-chip transient detection circuit which can detect electrical disturbances of system-level electrostatic discharge (ESD) is proposed. The circuit is designed with reduced physical area by utilizing dual-latched structure. With hardware/firmware co-design method, auto-recovery procedure can be activated by the detection circuit when microelectronic systems suffer system-level ESD events. The immunity level of microelectronic products against the electromagnetic interference (EMI) of ESD events can be effectively improved. The proposed on-chip transient detection circuit has been verified in a 0.18-mu m CMOS process with 1.8-V devices under system-level ESD tests.
URI: http://hdl.handle.net/11536/153303
ISBN: 978-1-5386-6989-1
期刊: 2018 IEEE REGION TEN SYMPOSIUM (TENSYMP)
起始頁: 36
結束頁: 39
顯示於類別:會議論文