標題: | On-chip Transient Detection Circuit for Microelectronic Systems against Electrical Transient Disturbances due to ESD Events |
作者: | Chen, Wen-Chieh Ker, Ming-Dou 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | electromagnetic compatibility (EMC);electrostatic discharge (ESD);system-level ESD;transient detection circuit |
公開日期: | 1-一月-2018 |
摘要: | A new on-chip transient detection circuit which can detect electrical disturbances of system-level electrostatic discharge (ESD) is proposed. The circuit is designed with reduced physical area by utilizing dual-latched structure. With hardware/firmware co-design method, auto-recovery procedure can be activated by the detection circuit when microelectronic systems suffer system-level ESD events. The immunity level of microelectronic products against the electromagnetic interference (EMI) of ESD events can be effectively improved. The proposed on-chip transient detection circuit has been verified in a 0.18-mu m CMOS process with 1.8-V devices under system-level ESD tests. |
URI: | http://hdl.handle.net/11536/153303 |
ISBN: | 978-1-5386-6989-1 |
期刊: | 2018 IEEE REGION TEN SYMPOSIUM (TENSYMP) |
起始頁: | 36 |
結束頁: | 39 |
顯示於類別: | 會議論文 |