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公開日期標題作者
1-六月-2013Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FETFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nein; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2011Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature SensitivityHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2016Benchmarking of Monolayer and Bilayer Two-Dimensional Transition Metal Dichalcogenide (TMD) Based Logic Circuits and 6T SRAM CellsYu, Chang-Hung; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based ApproachFan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2014Design Optimization of 16-nm Bulk FinFET Technology via Geometric ProgrammingSu, Ping-Hsun; Li, Yiming; 傳播研究所; Institute of Communication Studies
1-三月-2011FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate DielectricsHu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2013Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi ApproachChou, Shao-Heng; Fan, Ming-Long; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2015A Novel Approach Using Discrete Grain-Boundary Traps to Study the Variability of 3-D Vertical-Gate NAND Flash Memory CellsWang, Pei-Yu; Tsui, Bing-Yue; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2018Physics of Discrete Impurities under the Framework of Device Simulations for Nanostructure DevicesSano, Nobuyuki; Yoshida, Katsuhisa; Yao, Chih-Wei; Watanabe, Hiroshi; 電機工程學系; Department of Electrical and Computer Engineering
1-四月-2014Simulation and Investigation of Random Grain-Boundary-Induced Variabilities for Stackable NAND Flash Using 3-D Voronoi Grain PatternsYang, Ching-Wei; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Simulation of Grain-Boundary Induced V-th Variability in Stackable NAND Flash Using a Voronoi ApproachYang, Ching-Wei; Chao, Shao-Heng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-1970Statistical Prediction of Nanosized-Metal-Grain-Induced Threshold-Voltage Variability for 3D Vertically Stacked Silicon Gate-All-Around Nanowiren-MOSFETsSung, Wen-Li; Li, Yiming; 交大名義發表; 電機工程學系; 電信工程研究所; National Chiao Tung University; Department of Electrical and Computer Engineering; Institute of Communications Engineering
1-一月-2013Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM CellsHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2013Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold OperationHu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2012Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM ApplicationsFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009前瞻矽奈米元件變異性及傳輸特性綜合研究(I)蘇彬; Su Pin; 國立交通大學電子工程學系及電子研究所
2010前瞻矽奈米元件變異性及傳輸特性綜合研究(II)蘇彬; Su Pin; 國立交通大學電子工程學系及電子研究所
2005晶圓製造廠考量機台當機變異下產能擴充規劃模式之構建陳蕙純; Huei-Chun Chen; 鍾淑馨; Shu-Hsing Chung; 工業工程與管理學系
2008次32奈米多重閘極元件的特性分析與模式建立---變異性與微縮性，高頻類比特性，以及介觀現象的探討蘇彬; Su Pin; 國立交通大學電子工程學系及電子研究所
2012源/汲極串聯電阻引致對高度微縮金氧半元件汲極電流不匹配及變異之反饋效應研究蘇彬; Su Pin; 國立交通大學電子工程學系及電子研究所
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