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公開日期標題作者
1-八月-2008Characterization of poly-Si TFT variation using interdigitated methodHuang, Shih-Che; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-八月-2020Design Space Analysis for Cross-Point 1S1MTJ MRAM: Selector-MTJ CooptimizationChiang, Hung-Li; Chen, Tzu-Chiang; Song, Ming-Yuan; Chen, Yu-Sheng; Chiu, Jung-Piao; Chiang, Katherine; Manfrini, Mauricio; Cai, Jin; Gallagher, William J.; Wang, Tahui; Diaz, Carlos H.; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2008Fabrication and Characterization of Multiple-Gated Poly-Si Nanowire Thin-Film Transistors and Impacts of Multiple-Gate Structures on Device FluctuationsHsu, Hsing-Hui; Liu, Ta-Wei; Chan, Leng; Lin, Chuan-Ding; Huang, Tiao-Yuan; Lin, Horng-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2010Impact of Surface Orientation on the Sensitivity of FinFETs to Process Variations-An Assessment Based on the Analytical Solution of the Schrodinger EquationWu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2010Investigation and Analysis of Mismatching Properties for Nanoscale Strained MOSFETsKuo, Jack Jyun-Yan; Chen, William Po-Nien; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2008Multiple crack identification of a free-free beam with uniform material property variation and varied noised frequencyLin, Ren-Jeng; Cheng, Fu-Ping; 土木工程學系; Department of Civil Engineering
1-十一月-2008Sensitivity of Gate-All-Around Nanowire MOSFETs to Process Variations-A Comparison With Multigate MOSFETsWu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2008Sensitivity of multigate MOSFETs to process variations - An assessment based on analytical solutions of 3-D Poisson's equationWu, Yu-Sheng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2011SRAM Write-Ability Improvement With Transient Negative Bit-Line VoltageMukhopadhyay, Saibal; Rao, Rahul M.; Kim, Jae-Joon; Chuang, Ching-Te; 交大名義發表; National Chiao Tung University
1-十二月-2007A statistical model for simulating the effect of UPS TFT device variation for SOP applicationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-八月-2007Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTsKuo, Yan-Fu; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2000一維函數與二維的熵謝世峰; Shih-Feng Shieh; 莊重; Jonq Juang; 應用數學系所
2014三維金氧半電晶體基本邏輯閘電路的變異性模型洪健珉; Hung,Chien-Ming; 莊紹勳; Chung,Steve S.; 電子工程學系 電子研究所
2004低溫多晶矽薄膜電晶體數位電路變動性之模擬研究劉宏光; Hung-Guang Liu; 戴亞翔; Ya-Hsiang Tai; 光電工程學系
2004低溫多晶矽薄膜電晶體變動性之可靠度的研究余承和; Cheng-Ho Yu; 戴亞翔; Ya-Hsiang Tai; 光電工程學系
2008含材料變異自由樑在頻率量測誤差下之多裂縫診斷林仁正; Lin, Ren-Jeng; 鄭復平; Cheng, Fu-Ping; 土木工程學系
2008多晶矽薄膜電晶體的空間與時間變動性探討黃士哲; Huang, Shih-Che; 戴亞翔; Tai, Ya-Hsiang; 光電工程學系
2005對應低溫多晶矽薄膜電晶體變動性之電路模擬技術之研究陳琬萍; Wan-Ping Chen; 戴亞翔; Ya-Hsiang Tai; 顯示科技研究所
2000拓撲熵、全變差與單峰函數張秀禎; Hsiu-Chen Chang; 莊重; Dr. Jonq Juang; 應用數學系所
1996管弦樂曲太初及其創作之探討相似性材料在音樂中的運用劉釗; Liou, Luke; 楊聰賢, 吳丁連, 梁銘越; Tsung-Hsien Yang, Ting-Lien Wu; 應用藝術研究所
顯示 1 到 20 筆資料，總共 22 筆  下一頁 >