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Browsing by Author Chang, Wei-Yao

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Issue DateTitleAuthor(s)
1-Dec-2010An alternative bend-testing technique for a flexible indium tin oxide filmChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Wen, Bor-Jiunn; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
20-Dec-2010Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometryChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Nov-2014Collimation testing and calibration using a heterodyne Moire methodChang, Wei-Yao; Hsu, Ken Y.; Chen, Kun-Huang; Chen, Jing-Heng; 光電工程學系; Department of Photonics
2013Corneal surface reconstruction by using heterodyne moire methodChang, Wei-Yao; Chen, Kun-Huang; Chen, Der-Chin; Tseng, Jung-Kai; Chen, Shyan-Tarng; Sun, Han-Ying; Chen, Jing-Heng; Hsu, Ken Y.; 光電工程學系; Department of Photonics
1-十月-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Oct-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
2014Full-field refractive index measurement with simultaneous phase-shift interferometryChu, Yen-Chang; Chang, Wei-Yao; Chen, Kun-Huang; Chen, Jing-Heng; Tsai, Bo-Chung; Hsu, Ken Y.; 光電工程學系; Department of Photonics
1-三月-2014Heterodyne moire interferometry for measuring corneal surface profileChang, Wei-Yao; Chen, Kun-Huang; Chen, Der-Chin; Tseng, Jung-Kai; Chen, Shyan-Tarng; Sun, Han-Ying; Chen, Jing-Heng; Hsu, Ken Y.; 光電工程學系; Department of Photonics
10-二月-2014Heterodyne moire surface profilometryChang, Wei-Yao; Hsu, Fan-Hsi; Chen, Kun-Huang; Chen, Jing-Heng; Hsu, Ken Y.; 光電工程學系; Department of Photonics
20-七月-2011High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Hsieh, Hung-Chih; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-六月-2010Method for gauge block measurement with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Chen, Yen-Liang; Hsieh, Hung-Chih; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-四月-2011Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometryHsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十一月-2012Reconstruction of surface profile by using heterodyne moire methodChang, Wei-Yao; Hsu, Fan-Hsi; Chen, Kun-Huang; Chen, Jing-Heng; Hsieh, Hung-Chih; Hsu, Ken Y.; 光電工程學系; Department of Photonics
1-六月-2016Stress measurement of thin film on flexible substrate by using projection moire method and heterodyne interferometryChen, Kun-Huang; Chen, Jing-Heng; Tseng, Hua-Ken; Chang, Wei-Yao; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
2015外差疊紋干涉術的原理與其應用之研究張巍耀; Chang, Wei-Yao; 許根玉; 陳坤煌; Hsu, Ken Y.; Chen, Kun-Huang; 光電工程研究所
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