瀏覽 的方式: 作者 Chao, Mango Chia-Tso

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1-一月-2017Fast WAT Test Structure for Measuring Vt Variance Based on Latch-based ComparatorsLee, Kao-Chi; Wu, Kai-Chiang; Tsai, Chih-Ying; Chao, Mango Chia-Tso; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics
1-二月-2010A Metal-Only-ECO Solver for Input-Slew and Output-Loading ViolationsLu, Chien-Pang; Chao, Mango Chia-Tso; Lo, Chen-Hsing; Chang, Chih-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Methodology of Generating Timing-Slack-Based Cell-Aware TestsNien, Yu-Teng; Wu, Kai-Chiang; Lee, Dong-Zhen; Chen, Ying-Yen; Chen, Po-Lin; Chern, Mason; Lee, Jih-Nung; Kao, Shu-Yi; Chao, Mango Chia-Tso; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Micro-Architecture Optimization for Low-Power Bitcoin Mining ASICsWang, Yu-Zhe; Wu, Jingjie; Chen, Shi-Hao; Chao, Mango Chia-Tso; Yang, Chia-Hsiang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015利用平行測量與模型化隨機森林預測臨界電壓平均數與變異數蔡知螢; Tsai, Chih-Ying; 趙家佐; Chao, Mango Chia-Tso; 電子工程學系 電子研究所