標題: Methodology of Generating Timing-Slack-Based Cell-Aware Tests
作者: Nien, Yu-Teng
Wu, Kai-Chiang
Lee, Dong-Zhen
Chen, Ying-Yen
Chen, Po-Lin
Chern, Mason
Lee, Jih-Nung
Kao, Shu-Yi
Chao, Mango Chia-Tso
資訊工程學系
電子工程學系及電子研究所
Department of Computer Science
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2019
摘要: In order to reduce DPPM (defect parts per million), cell-aware (CA) methodology was proposed to cover various types of intra-cell defects. The resulting CA faults can be a 1-time-frame (ltf) or 2-time-frame (2tf) fault, and 2tf CA tests were experimentally verified to be capable of catching a significant number of defective parts not covered by other conventional tests. In this paper, we present a novel methodology for generating 2tf CA tests based on timing slack analysis. The proposed 2tf CA fault model, aware of timing slack and named TS, defines a fault (i) on a cell instance basis, and (ii) based on per-instance timing criticality (according to timing slack). More explicitly, for each cell instance with a specific defect injected, we check its output capacitive load and derive the corresponding extra delay. By comparing the extra delay against timing slack of the cell instance, a delay fault can be defined, and according to its severity, the fault can be further classified into small-delay fault or gross-delay fault. In contrast to prior 2tf CA methodology that is on a cell (rather than cell instance) basis and unaware of timing criticality/slack, our methodology can identify "more realistic" faults which really need to be considered, and potentially the cost/effort for testing those 2tf CA faults can be reduced. Experimental results on a set of 28nm industrial designs demonstrate that, due to more realistic fault identification, the numbers of identified small-delay faults and corresponding test patterns to be applied can be reduced by 35.1% and 24.1% respectively, leading to 40.7% reduction in the runtime of ATPG.
URI: http://hdl.handle.net/11536/155015
ISBN: 978-1-7281-4823-6
ISSN: 1089-3539
期刊: 2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC)
起始頁: 0
結束頁: 0
顯示於類別:會議論文