標題: | Methodology of Generating Timing-Slack-Based Cell-Aware Tests |
作者: | Nien, Yu-Teng Wu, Kai-Chiang Lee, Dong-Zhen Chen, Ying-Yen Chen, Po-Lin Chern, Mason Lee, Jih-Nung Kao, Shu-Yi Chao, Mango Chia-Tso 資訊工程學系 電子工程學系及電子研究所 Department of Computer Science Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-一月-2019 |
摘要: | In order to reduce DPPM (defect parts per million), cell-aware (CA) methodology was proposed to cover various types of intra-cell defects. The resulting CA faults can be a 1-time-frame (ltf) or 2-time-frame (2tf) fault, and 2tf CA tests were experimentally verified to be capable of catching a significant number of defective parts not covered by other conventional tests. In this paper, we present a novel methodology for generating 2tf CA tests based on timing slack analysis. The proposed 2tf CA fault model, aware of timing slack and named TS, defines a fault (i) on a cell instance basis, and (ii) based on per-instance timing criticality (according to timing slack). More explicitly, for each cell instance with a specific defect injected, we check its output capacitive load and derive the corresponding extra delay. By comparing the extra delay against timing slack of the cell instance, a delay fault can be defined, and according to its severity, the fault can be further classified into small-delay fault or gross-delay fault. In contrast to prior 2tf CA methodology that is on a cell (rather than cell instance) basis and unaware of timing criticality/slack, our methodology can identify "more realistic" faults which really need to be considered, and potentially the cost/effort for testing those 2tf CA faults can be reduced. Experimental results on a set of 28nm industrial designs demonstrate that, due to more realistic fault identification, the numbers of identified small-delay faults and corresponding test patterns to be applied can be reduced by 35.1% and 24.1% respectively, leading to 40.7% reduction in the runtime of ATPG. |
URI: | http://hdl.handle.net/11536/155015 |
ISBN: | 978-1-7281-4823-6 |
ISSN: | 1089-3539 |
期刊: | 2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC) |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 會議論文 |