標題: Methodology of Generating Dual-Cell-Aware Tests
作者: Huang, Yu-Hao
Lu, Ching-Ho
Wu, Tse-Wei
Nien, Yu-Teng
Chen, Ying-Yen
Wu, Max
Lee, Jih-Nung
Chao, Mango C. -T.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2017
摘要: This paper introduces a novel fault model, called the dual-cell-aware (DCA) fault model, which targets the short defects locating between two adjacent standard cells placed in the layout. A layout-based methodology is also presented to automatically extract valid DCA faults from targeted designs and cell libraries. The identified DCA faults are outputted in a format that can be applied to a commercial ATPG tool for test generation. The result of ATPG and fault simulation based on industrial designs have demonstrated that the DCA faults cannot be fully covered by the tests of conventional fault models including stuck-at, transition, bridge and cell-aware faults and hence require their own designated tests to detect.
URI: http://hdl.handle.net/11536/146628
ISSN: 1093-0167
期刊: 2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS)
顯示於類別:會議論文