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公開日期標題作者
1-十月-2018Analog and RF Characteristics of Power FinFET Transistors With Different Drain-Extension DesignsChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Hsiu-Chih; Chen, Chun-Chi; Hsueh, Fu-Kuo; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
2005An analysis of base current effect on the anomalous dip of scattering parameter S(12) in SiGeHBTsChen, Han-Yu; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Chun-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2008Analysis of temperature effects on high-frequency characteristics of RF lateral-diffused metal-oxide-semiconductor transistorsHu, Hsin-Hui; Chen, Kun-Ming; Huang, Guo-Wei; Chien, Alex; Cheng, Eric; Yang, Yu-Chi; Chang, Chun-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Capacitance Characteristics Improvement and Power Enhancement for RF LDMOS Transistors Using Annular Layout StructureChiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Chen, Ming-I.; Yang, Yu-Chi; Wang, Kai-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2013Channel Thickness Effect on High-Frequency Performance of Poly-Si Thin-Film TransistorsChen, Kun-Ming; Tsai, Tzu-I; Lin, Ting-Yao; Lin, Horng-Chih; Chao, Tien-Sheng; Huang, Guo-Wei; Huang, Tiao-Yuan; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
2009Characterization of Annular-Structure RF LDMOS Transistors Using Polyharmonic Distortion ModelChiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Hsiao, Chih-Hua; Liao, Kuo-Hsiang; Chen, Wen-Lin; Wang, Sheng-Chiun; Chen, Ming-Yi; Yang, Yu-Chi; Wang, Kai-Li; Wu, Lin-Kun; 電信工程研究所; Institute of Communications Engineering
1-四月-2007Characterization of RF lateral-diffused metal-oxide-semiconductor field-effect transistors with different layout structuresHu, Hsin-Hui; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Chun-Yen; Lu, Yii-Chian; Yang, Yu-Chi; Cheng, Eric; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2010Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave ApplicationsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2019DC and high-frequency characteristics of trigate polycrystalline-silicon thin-film transistors with different layout geometriesChen, Bo-Yuan; Chen, Kun-Ming; Shiao, Yu-Shao Jerry; Lin, Chuang-Ju; Huang, Guo-Wei; Chen, Hsiu-Chih; Hsueh, Fu-Kuo; Shen, Chang-Hong; Shieh, Jia-Min; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
2007Design for integration of RF power transistors in 0.13 mu m advanced CMOS technologyHuang, Sheng-Yi; Chen, Kun-Ming; Huang, Guo-Wei; Chang, Chun-Yen; Hung, Cheng-Chou; Liang, Victor; Chen, Bo-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Effect of NH(3) Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETsChen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETsChen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2016High-frequency performances of superjunction laterally diffused metal-oxide-semiconductor transistors for RF power applicationsChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
四月-2016High-frequency performances of superjunction laterally diffused metal-oxide-semiconductor transistors for RF power applicationsChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
2008Impact of Body Bias on the High Frequency Performance of Partially Depleted SOI MOSFETsHuang, Guo-Wei; Chen, Kun-Ming; Chen, Han-Yu; Huang, Chi-Huan; Chang, Chun-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2010Impact of Highly Compressive Interlayer-Dielectric-SiN(x) Stressing Layer on 1/f Noise and Reliability of SiGe-Channel pMOSFETsChen, Yu-Ting; Chen, Kun-Ming; Liao, Wen-Shiang; Huang, Guo-Wei; Huang, Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2010Impact of Highly Compressive Interlayer-Dielectric-SiNx Stressing Layer on 1/f Noise and Reliability of SiGe-Channel pMOSFETsChen, Yu-Ting; Chen, Kun-Ming; Liao, Wen-Shiang; Huang, Guo-Wei; Huang, Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2012Investigation of Hot-Carrier Stress Effect on High-Frequency Performance of Laterally Diffused Metal-Oxide-Semiconductor TransistorsChen, Kun-Ming; Mou, Zong-Wen; Kuo, Hao-Chung; Chiu, Chia-Sung; Chen, Bo-Yuan; Liu, Wen-De; Chen, Ming-Yi; Yang, Yu-Chi; Wang, Kai-Li; Huang, Guo-Wei; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
1-三月-2012Investigation of Temperature-Dependent High-Frequency Noise Characteristics for Deep-Submicrometer Bulk and SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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