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公開日期標題作者
20103D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate DevicesCheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming; 傳播研究所; Institute of Communication Studies
2007Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperatureLi, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang; 電信工程研究所; Institute of Communications Engineering
2010Comparative Study of Multigate and Multifin Metal-Oxide-Semiconductor Field-Effect TransistorCheng, Hui-Wen; Li, Yiming; 傳播研究所; 電機工程學系; Institute of Communication Studies; Department of Electrical and Computer Engineering
2008Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET DevicesHwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
1-一月-2018Define high quality Type-I InGaAsSb/AlGaAsSb QW laser fabrication process with high-resolution x-ray diffractionCheng, Hui-Wen; Lin, Chien-Hung; Lee, Chien-Ping; 電機學院; 電子工程學系及電子研究所; 奈米科技中心; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics; Center for Nanoscience and Technology
1-一月-2014Design of Miniaturized Antenna and Power Harvester Circuit on the Enucleated Porcine EyesCheng, Hui-Wen; Yu, Tsung-Chi; Huang, Hong-Yi; Ting, Ssu-Han; Huang, Tzuen-Hsi; Chiou, Jin-Chern; Luo, Ching-Hsing; 電機工程學系; Department of Electrical and Computer Engineering
1-一月-2014Design of Miniaturized Antenna and Power Harvester Circuit on the Enucleated Porcine EyesCheng, Hui-Wen; Yu, Tsung-Chi; Huang, Hong-Yi; Ting, Ssu-Han; Huang, Tzuen-Hsi; Chiou, Jin-Chern; Luo, Ching-Hsing; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
3-七月-2013Device Simulation-Based Multiobjective Evolutionary Algorithm for Process Optimization of Semiconductor Solar CellsLi, Yiming; Chen, Yu-Yu; Chen, Chieh-Yang; Shen, Cheng-Han; Cheng, Hui-Wen; Lo, I-Hsiu; Chen, Chun-Nan; 資訊工程學系; Department of Computer Science
1-四月-2009Discrete-Dopant-Fluctuated Transient Behavior and Variability Suppression in 16-nm-Gate Complementary Metal-Oxide-Semiconductor Field-Effect TransistorsLi, Yiming; Hwang, Chih-Hong; Cheng, Hui-Wen; 電信工程研究所; Institute of Communications Engineering
14-三月-2019Effect of Etching Depth on Threshold Characteristics of GaSb-Based Middle Infrared Photonic-Crystal Surface-Emitting LasersLi, Zong-Lin; Lin, Shen-Chieh; Lin, Gray; Cheng, Hui-Wen; Sun, Kien-Wen; Lee, Chien-Ping; 應用化學系; 電子工程學系及電子研究所; 奈米科技中心; Department of Applied Chemistry; Department of Electronics Engineering and Institute of Electronics; Center for Nanoscience and Technology
1-三月-2012Effect of Flash Lamp Annealing and Laser Spike Annealing on Random Dopant Fluctuation of 15-nm Metal-Oxide-Semiconductor DevicesCheng, Hui-Wen; Hwang, Chih-Hong; Chao, Ko-An; Li, Yiming; 材料科學與工程學系; Department of Materials Science and Engineering
2009Effect of Process Variation on 15-nm-Gate Stacked Multichannel Surrounding-Gate Field Effect TransistorHan, Ming-Hung; Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming; 傳播研究所; Institute of Communication Studies
2011Effects of Random Work Function Fluctuations in Nanoszied Metal Grains on Electrical Characteristic of 16 nm High-kappa/Metal Gate Bulk FinFETsCheng, Hui-Wen; Chiu, Yung-Yueh; Li, Yiming; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
2-十一月-2009Electrical characteristics dependence on the channel fin aspect ratio of multi-fin field effect transistorsCheng, Hui-Wen; Li, Yiming; 傳播研究所; 電子工程學系及電子研究所; Institute of Communication Studies; Department of Electronics Engineering and Institute of Electronics
2009Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect RatioCheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
2008Emission Efficiency Dependence on the Tilted Angle of Nanogaps in Surface Conduction Electron-EmitterLi, Yiming; Kuo, Yi-Ting; Cheng, Hui-Wen; Yeh, Ta-Ching; Lo, Hsiang-Yu; Chiang, Mei-Tsao; Mo, Chi-Neng; 電信工程研究所; Institute of Communications Engineering
2009Enhancement of Field Emission on Surface Conduction Electron-EmittersCheng, Hui-Wen; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
1-四月-2008Field emission property of carbon nanotube field emitters in triode structure fabricated with anodic aluminum oxide templatesLi, Yiming; Cheng, Hui-Wen; Lin, Chen-Chun; Pan, Fu-Ming; 材料科學與工程學系; 電信工程研究所; Department of Materials Science and Engineering; Institute of Communications Engineering
2007Field emission property of CNT field emitters in the triode structure with anodic aluminum oxide templateCheng, Hui-Wen; Lin, Chen-Chun; Li, Yiming; Pan, Fu-Ming; 電信工程研究所; Institute of Communications Engineering
1-五月-2009Field Emission Stability of Anodic Aluminum Oxide Carbon Nanotube Field Emitter in the Triode StructureLi, Yiming; Cheng, Hui-Wen; 電信工程研究所; Institute of Communications Engineering
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