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1-十一月-1998Effects of thermal N-2 annealing on passivation capability of sputtered Ta(-N) layers against Cu oxidationChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1998Effects of thermal N-2 annealing on passivation capability of sputtered Ta(-N) layers against Cu oxidationChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
14-十二月-1998Formation of Cr-O and Cr-N-O films serving as Cu oxidation resistant layers and their N-2 pre-sintering effectChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
14-十二月-1998Formation of Cr-O and Cr-N-O films serving as Cu oxidation resistant layers and their N-2 pre-sintering effectChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1998Passivation of Cu by sputter-deposited Ta and reactively sputter-deposited Ta-nitride layersChuang, JC; Chen, NC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1998Properties of sputtered Cr-O and reactively sputtered Cr-N-O as passivation layers against copper oxidationChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1998Properties of sputtered Cr-O and reactively sputtered Cr-N-O as passivation layers against copper oxidationChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
8-六月-1998Properties of thin Ta-N films reactively sputtered on Cu/SiO2/Si substratesChuang, JC; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2004Quadtree-segmented image compression method using vector quantization and cubic B-spline interpolationChang, CC; Chuang, JC; Chung, CY; 資訊工程學系; Department of Computer Science
1-十二月-1998Sputtered Cr and reactively sputtered CrNx serving as barrier layers against copper diffusionChuang, JC; Tu, SL; Chen, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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