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公開日期標題作者
1-二月-1990ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMSHO, JH; LEE, CL; LEI, TF; CHAO, TS; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-八月-1990ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMSHO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-九月-1987ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-AHO, JH; LEE, CL; JEN, CW; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-八月-1988ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMSHO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-八月-1991A REAL-TIME C-V MEASUREMENT CIRCUIT FOR MOS CAPACITORS UNDER CURRENT STRESSINGLEE, CL; LEI, TF; HO, JH; WANG, WT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
3-八月-1989REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRYHO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
顯示 1 到 6 筆資料，總共 6 筆