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15-一月-20084-Port polarization-independent wavelength-interleaving bidirectional circulatorHsieh, Po-Jen; Chen, Jing-Heng; Hsieh, Hung-Chih; Jian, Zhi-Cheng; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十二月-2010An alternative bend-testing technique for a flexible indium tin oxide filmChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Wen, Bor-Jiunn; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
20-十二月-2010Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometryChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十月-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十月-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
20-七月-2011High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Hsieh, Hung-Chih; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-六月-2010Method for gauge block measurement with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Chen, Yen-Liang; Hsieh, Hung-Chih; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十二月-2006A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometryJian, Zhi-Cheng; Hsieh, Po-Jen; Hsieh, Hung-Chih; Chen, Huei-Wen; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十二月-2008Nano-roughness measurements with a modified Linnik microscope and the uses of full-field heterodyne interferometryChen, Yen-Liang; Jian, Zhi-Cheng; Hsieh, Hung-Chih; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十一月-2007Optimal condition for full-field heterodyne interferometryJian, Zhi-Cheng; Chen, Yen-Liang; Hsieh, Hung-Chih; Hsieh, Po-Jen; Su, Der-Chin; 光電工程學系; Department of Photonics
1-四月-2011Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometryHsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-十一月-2012Reconstruction of surface profile by using heterodyne moire methodChang, Wei-Yao; Hsu, Fan-Hsi; Chen, Kun-Huang; Chen, Jing-Heng; Hsieh, Hung-Chih; Hsu, Ken Y.; 光電工程學系; Department of Photonics
1-二月-2009Two-wavelength full-field heterodyne interferometric profilometryHsieh, Hung-Chih; Chen, Yen-Liang; Jian, Zhi-Chen; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics
2010使用新穎取樣技術之全場外差干涉儀謝鴻志; Hsieh, Hung-Chih; 蘇德欽; Su, Der-Chin; 光電工程學系
顯示 1 到 14 筆資料，總共 14 筆