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1-七月-2019Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD ProcessNidhi, Karuna; Ker, Ming-Dou; Lee, Jian-Hsing; Huang, Shao-Chang; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-六月-2020Energy Transformation Between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) TestNidhi, Karuna; Lee, Jian-Hsing; Huang, Shao-Chang; Ker, Ming-Dou; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-七月-2018Improving Safe-Operating-Area o f a 5-V n-Channel Large Array MOSFET in a 0.15-mu m BCD ProcessNidhi, Karuna; Ker, Ming-Dou; Lin, Tingyou; Lee, Jian-Hsing; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics
1-七月-2011Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD ProtectionLee, Jian-Hsing; Huang, Shao-Chang; Su, Hung-Der; Chen, Ke-Horng; 電控工程研究所; Institute of Electrical and Control Engineering
1-八月-2012Two-stage trigger silicon-controller rectifier (SCR) for radio-frequency (RF) input and output protections in nanometer technologiesLee, Jian-Hsing; Wu, Yi-Hsun; Huang, Shao-Chang; Lee, Yu-Huei; Chen, Ke-Horng; 電控工程研究所; Institute of Electrical and Control Engineering
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