1. 目前位置：

瀏覽 的方式： 作者 Lin, YH

跳到： 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
或是輸入前幾個字：  
顯示 1 到 20 筆資料，總共 38 筆  下一頁 >
公開日期標題作者
20052-bit poly-Si-TFT nonvolatile memory using hafnium oxide, hafnium silicate and zirconium silicateLin, YH; Chien, CH; Chou, TH; Chao, TS; Chang, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2005All-optical data format conversion in synchronously modulated single-mode Fabry-Perot laser diode using external injection-locking-induced nonlinear threshold reduction effectLin, GR; Chang, YC; Lin, YH; Chen, JH; 光電工程學系; Department of Photonics
20-九月-2004All-optical NRZ-to-PRZ format transformer with an injection-locked Fabry-Perot laser diode at unlasing conditionChang, YC; Lin, YH; Chen, JH; Lin, GR; 光電工程學系; Department of Photonics
2005Anaphora resolution for biomedical literature by exploiting multiple resourcesLiang, T; Lin, YH; 資訊工程學系; Department of Computer Science
1-五月-2006Annealing temperature effect on the performance of nonvolatile HfO2Si-oxide-nitride-oxide-silicon-type flash memoryLin, YH; Chien, CH; Chang, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2003Brownian dynamics simulations of the effects of hydrodynamic interactions on the polymer viscoelastic behaviorYang, DJ; Lin, YH; 應用化學系; Department of Applied Chemistry
8-五月-1999Chain dynamics of concentrated polystyrene solutions studied by depolarized photon-correlation and viscosity measurementsLai, CS; Juang, JH; Lin, YH; 應用化學系; Department of Applied Chemistry
1-二月-1998Correlation of stress-induced leakage current with generated positive trapped charges for ultrathin gate oxideLin, YH; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-1998Correlation of stress-induced leakage current with generated positive trapped charges for ultrathin gate oxideLin, YH; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2001Cu contamination effect in oxynitride gate dielectricsLin, YH; Pan, FM; Liao, YC; Chen, YC; Hsieh, IJ; Chin, A; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2003Direct observation of long-term durability of superconductivity in YBa2Cu3O7-Ag2O compositesLin, JJ; Lin, YH; Huang, SM; Lee, TC; Chen, TM; 物理研究所; Institute of Physics
15-七月-1996Dynamics of a ''Rouse'' segment as probed by depolarized photon-correlation and viscoelasticity measurementsLin, YH; Lai, CS; 交大名義發表; 應用化學系; National Chiao Tung University; Department of Applied Chemistry
2005The effect of backward injecting wavelength on the mode-locking dynamics of a semiconductor amplifier based fiber laserChu, YS; Liao, YS; Lin, YH; Chang, YC; Lin, GR; 光電工程學系; Department of Photonics
1-十一月-2000The effect of copper on gate oxide integrityLin, YH; Wu, YH; Chin, A; Pan, FM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004High performance multi-bit nonvolatile HfO2 nanocrystal memory using spinodal phase separation of hafnium silicateLin, YH; Chien, CH; Lin, CT; Chen, CW; Chang, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2005High-perfomance nonvolatile HfO2 nanocrystal memoryLin, YH; Chien, CH; Lin, CT; Chang, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
17-十一月-2004Low temperature electrical transport properties of RuO2 and IrO2 single crystalsLin, JJ; Huang, SM; Lin, YH; Lee, TC; Liu, H; Zhang, XX; Chen, RS; Huang, YS; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
1-九月-2004Mobility enhancement of MOSFETs on p-silicon (111) with in situ HF-Vapor. pre-gate oxide cleaningChao, TS; Lin, YH; Yang, WL; 電子物理學系; Department of Electrophysics
1-八月-2004Mode beating noise reduction of mutually injection-locked erbium-doped fiber laser and laser diode linkLin, YH; Lin, GR; 光電工程學系; Department of Photonics
1-九月-1997Monitoring trapped charge generation for gate oxide under stressLin, YH; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 20 筆資料，總共 38 筆  下一頁 >