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公開日期標題作者
15-一月-2002Addenda to photoluminescence and electron paramagnetic resonance studies of defect centers in porous siliconLue, HT; Tseng, CY; Lue, JT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2001Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin filmsLue, HT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2002Device modeling of ferroelectric memory field-effect transistor (FeMFET)Lue, HT; Wu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2003Device Modeling of ferroelectric memory field-effect transistor for the application of ferroelectric random access memoryLue, HT; Wu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2-十二月-2002Effects of nitridation of silicon and repeated spike heating on the electrical properties of SrTiO3 gate dielectricsLiu, CY; Lue, HT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2000Fermi and anti-Fermi glass transition and subband resonant quantum tunneling in Nb/Ti metallic multilayer filmsLue, JT; Liang, SY; Lee, YW; Lue, HT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2002An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectricLue, HT; Liu, CY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2004Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin filmsHuang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-四月-2002A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurementLue, HT; Tseng, TY; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2002Microwave penetration depth measurement for high T-c superconductors by dielectric resonatorsLue, HT; Lue, JT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurementLue, HT; Tseng, TY; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-六月-2000Photoluminescence and electron paramagnetic resonance studies of defect centers in porous siliconLue, HT; Huang, BY; Lue, JT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 12 筆資料，總共 12 筆