Skip navigation
瀏覽
學術出版
教師專書
期刊論文
會議論文
研究計畫
畢業論文
專利資料
技術報告
數位教材
開放式課程
專題作品
喀報
交大建築展
明竹
活動紀錄
圖書館週
研究攻略營
畢業典禮
開學典禮
數位典藏
楊英風數位美術館
詩人管管數位典藏
歷史新聞
交大 e-News
交大友聲雜誌
陽明交大電子報
陽明交大英文電子報
陽明電子報
校內出版品
交大出版社
交大法學評論
管理與系統
新客家人群像
全球客家研究
犢:傳播與科技
資訊社會研究
交大資訊人
交大管理學報
數理人文
交大學刊
交通大學學報
交大青年
交大體育學刊
陽明神農坡彙訊
校務大數據研究中心電子報
人間思想
文化研究
萌牙會訊
Inter-Asia Cultural Studies
醫學院年報
醫學院季刊
陽明交大藥學系刊
永續發展成果年報
Open House
畢業紀念冊
畢業紀念冊
項目
公開日期
作者
標題
關鍵字
研究人員
English
繁體
简体
目前位置:
國立陽明交通大學機構典藏
瀏覽 的方式: 作者 Wang, TH
跳到:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
或是輸入前幾個字:
排序方式:
標題
公開日期
上傳日期
排序方式:
升冪排序
降冪排序
結果/頁面
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
作者/紀錄:
全部
1
5
10
15
20
25
30
35
40
45
50
顯示 1 到 20 筆資料,總共 52 筆
下一頁 >
公開日期
標題
作者
1-一月-1996
Analysis of high-field hole transport characteristics in Si1-xGex alloys with a bond orbital band structure
Liou, TS
;
Wang, TH
;
Chang, CY
;
交大名義發表
;
電子工程學系及電子研究所
;
National Chiao Tung University
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2002
Arsenic/phosphorus LDD optimization by taking advantage of phosphorus transient enhanced diffusion for high voltage input/output CMOS devices
Wang, HCH
;
Wang, CC
;
Diaz, CH
;
Liew, BK
;
Sun, JYC
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2003
Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias
Tsai, CW
;
Chen, MC
;
Ku, SH
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2006
Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique
Gu, SH
;
Wang, TH
;
Lu, WP
;
Ting, WC
;
Ku, YHJ
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1997
Characterization of various stress-induced oxide traps in MOSFET's by using a novel transient current technique
Wang, TH
;
Chiang, LP
;
Zous, NK
;
Chang, TE
;
Huang, C
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-八月-1998
Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique
Wang, TH
;
Chiang, LP
;
Zous, NK
;
Chang, TE
;
Huang, C
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1999
A comparative study of SILC transient characteristics and mechanisms in FN stressed and hot hole stressed tunnel oxides
Zous, NK
;
Wang, TH
;
Yeh, CC
;
Tsai, CW
;
Huang, CM
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
15-九月-2004
Comparison of oxide breakdown progression in ultra-thin oxide silicon-on-insulator and bulk metal-oxide-semiconductor field effect transistors
Chen, MC
;
Ku, SH
;
Chan, CT
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2004
Comparison of oxide breakdown progression in ultra-thin oxide SOI and bulk pMOSFETs
Chan, CT
;
Kuo, CH
;
Tang, CJ
;
Chen, MC
;
Wang, TH
;
Lu, SH
;
Hu, HC
;
Chen, TF
;
Yang, CK
;
Lee, MT
;
Wu, DY
;
Chen, JK
;
Chien, SC
;
Sun, SW
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-九月-1999
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
Wang, TH
;
Chiang, LP
;
Zous, NK
;
Hsu, CF
;
Huang, LY
;
Chao, TS
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-二月-2006
Copper interconnect electromigration behavior in various structures and precise bimodal fitting
Lin, MH
;
Lin, YL
;
Chang, KP
;
Sul, KC
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2005
Electromigration lifetime improvement of copper interconnect by cap/dielectric interface treatment and geometrical design
Lin, MH
;
Lin, YL
;
Chen, JM
;
Yeh, MS
;
Chang, KP
;
Su, KC
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-五月-2004
An endurance evaluation method for flash EEPROM
Zous, NK
;
Chen, YJ
;
Chin, CY
;
Tsai, WJ
;
Lu, TC
;
Chen, MS
;
Lu, WP
;
Wang, TH
;
Pan, SC
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2002
Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage
Lee, DY
;
Lin, HC
;
Wang, MF
;
Tsai, MY
;
Huang, TY
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-九月-2005
Excess low-frequency noise in ultrathin oxide n-MOSFETs arising from valence-band electron tunneling
Wu, JW
;
You, JW
;
Ma, HC
;
Cheng, CC
;
Hsu, CF
;
Chang, CS
;
Huang, GW
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
25-八月-1997
Field and temperature effects on oxide charge detrapping in a metal-oxide-semiconductor field effect transistor by measuring a subthreshold current transient
Chiang, LP
;
Zous, NK
;
Wang, TH
;
Chang, TE
;
Shen, KY
;
Huang, C
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1996
Field enhanced oxide charge detrapping in n-MOSFET's
Wang, TH
;
Chang, TE
;
Chiang, LP
;
Huang, C
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2002
A global pinching theorem for surfaces with constant mean curvature in S-3
Hsu, YJ
;
Wang, TH
;
應用數學系
;
Department of Applied Mathematics
1-一月-2001
A global pinching theorem for surfaces with constant mean curvature in S-3
Hsu, YJ
;
Wang, TH
;
應用數學系
;
Department of Applied Mathematics
1-十二月-2000
Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology
Wang, HCH
;
Diaz, CH
;
Liew, BK
;
Sun, JYC
;
Wang, TH
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics