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公開日期標題作者
1-二月-20011.55-mu m and infrared-band photoresponsivity of a Schottky barrier porous silicon photodetectorLee, MK; Chu, CH; Wang, YH; Sze, SM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1999Effects of film stress on the chemical mechanical polishing processTseng, WT; Wang, YH; Chin, JH; 機械工程學系; Department of Mechanical Engineering
2003Estimation of dynamic origin-destination by Gaussian state space model with unknown transition matrixJou, YJ; Hwang, MC; Wang, YH; Chang, CH; 統計學研究所; Institute of Statistics
29-四月-2003Liquid phase deposited SiO2 on GaNWu, HR; Lee, KW; Nian, TB; Chou, DW; Wu, JJH; Wang, YH; Houng, MP; Sze, PW; Su, YK; Chang, SJ; Ho, CH; Chiang, CI; Chern, YT; Juang, FS; Wen, TC; Lee, WI; Chyi, JI; 電子物理學系; Department of Electrophysics
10-十月-2001Magneto-optic imaging of proton-irradiated high T-c superconducting thin films: A revisit of J(c)(T) functional and flux pinning enhancementWang, C; Seo, HW; Su, CJ; Wang, YH; Chen, QY; Lu, XM; Liu, JR; Johansen, T; Chu, WK; 材料科學與工程學系; Department of Materials Science and Engineering
1-十月-2005A scalable noise de-embedding technique for on-wafer microwave device characterizationCho, MH; Huang, GW; Wang, YH; Wu, LK; 電信工程研究所; Institute of Communications Engineering
1-九月-2005A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETsCho, MH; Huang, GW; Wu, LK; Chiu, CS; Wang, YH; Chen, KM; Tsen, HC; Hsu, TL; 電信工程研究所; Institute of Communications Engineering
2004Study of annealing and exchange bias effects in PtMn based magnetic tunnel junction systemPeng, TY; Yao, YD; Chen, SY; Wang, YH; Chen, WC; Gao, MJ; Tang, DD; 材料科學與工程學系; Department of Materials Science and Engineering
1-九月-2003Wafer bonding by Ni-induced crystallization of amorphous siliconChao, CP; Wu, YCS; Lee, TL; Wang, YH; 材料科學與工程學系; Department of Materials Science and Engineering