標題: A scalable noise de-embedding technique for on-wafer microwave device characterization
作者: Cho, MH
Huang, GW
Wang, YH
Wu, LK
電信工程研究所
Institute of Communications Engineering
關鍵字: calibration;de-embedding;MOSFET;noise;S-parameters
公開日期: 1-十月-2005
摘要: In this letter, we present a scalable and efficient noise de-embedding procedure, which is based on transmission-line theory and cascade configurations, for on-wafer microwave measurements of silicon MOSFETs. The proposed de-embedding procedure utilizes one open and one thru dummy structures to eliminate the parasitic effects from the probe pads and the input/output interconnects of a device-under-test (DUT), respectively. This method can generate the scalable distributed interconnect parameters to efficiently and precisely remove the redundant parasitics of the DUTs with various device sizes and arbitrary interconnect dimensions.
URI: http://dx.doi.org/10.1109/LMWC.2005.856685
http://hdl.handle.net/11536/13225
ISSN: 1531-1309
DOI: 10.1109/LMWC.2005.856685
期刊: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Volume: 15
Issue: 10
起始頁: 649
結束頁: 651
顯示於類別:期刊論文


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