| 標題: | Method for fabricating a resistor for a resistance random access memory |
| 作者: | Tseng Tseung-Yuen Wang Sheng-Yu Tsai Chen-Han |
| 公開日期: | 25-六月-2013 |
| 摘要: | A method for fabricating a resistor for a resistance random access memory (RRAM) includes: (a) forming a first electrode over a substrate; (b) forming a variable resistance layer of zirconium oxide on the first electrode under a working temperature, which ranges from 175° C. to 225° C.; and (c) forming a second electrode of Ti on the variable resistance layer. |
| 官方說明文件#: | H01L021/20 H01L021/00 H01L021/16 |
| URI: | http://hdl.handle.net/11536/104470 |
| 專利國: | USA |
| 專利號碼: | 08470637 |
| 顯示於類別: | 專利資料 |

