標題: | Method for fabricating a resistor for a resistance random access memory |
作者: | Tseng Tseung-Yuen Wang Sheng-Yu Tsai Chen-Han |
公開日期: | 25-Jun-2013 |
摘要: | A method for fabricating a resistor for a resistance random access memory (RRAM) includes: (a) forming a first electrode over a substrate; (b) forming a variable resistance layer of zirconium oxide on the first electrode under a working temperature, which ranges from 175° C. to 225° C.; and (c) forming a second electrode of Ti on the variable resistance layer. |
官方說明文件#: | H01L021/20 H01L021/00 H01L021/16 |
URI: | http://hdl.handle.net/11536/104470 |
專利國: | USA |
專利號碼: | 08470637 |
Appears in Collections: | Patents |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.