Method for determining the fast axis and phase retardation of a wave plate

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DC 欄位	值	語言
dc.contributor.author	Chiu, MH	en_US
dc.contributor.author	Chen, CD	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2014-12-08T15:02:24Z	-
dc.date.available	2014-12-08T15:02:24Z	-
dc.date.issued	1996-09-01	en_US
dc.identifier.issn	0740-3232	en_US
dc.identifier.uri	http://hdl.handle.net/11536/1075	-
dc.description.abstract	Based on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America.	en_US
dc.language.iso	en_US	en_US
dc.title	Method for determining the fast axis and phase retardation of a wave plate	en_US
dc.type	Article	en_US
dc.identifier.journal	JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION	en_US
dc.citation.volume	13	en_US
dc.citation.issue	9	en_US
dc.citation.spage	1924	en_US
dc.citation.epage	1929	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Photonics	en_US
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