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dc.contributor.authorChiu, MHen_US
dc.contributor.authorChen, CDen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:02:24Z-
dc.date.available2014-12-08T15:02:24Z-
dc.date.issued1996-09-01en_US
dc.identifier.issn0740-3232en_US
dc.identifier.urihttp://hdl.handle.net/11536/1075-
dc.description.abstractBased on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleMethod for determining the fast axis and phase retardation of a wave plateen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISIONen_US
dc.citation.volume13en_US
dc.citation.issue9en_US
dc.citation.spage1924en_US
dc.citation.epage1929en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Photonicsen_US
Appears in Collections:Articles


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