標題: | Performance improvement of CoTiO3 high-k dielectrics with nitrogen incorporation |
作者: | Chen, Jian Hao Huang, Tzung Bin Wu, Xiaohua Landheer, Dolf Lei, Tan Fu Chao, Tien Sheng 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2007 |
摘要: | In this paper, three approaches to incorporating nitrogen in CoTiO3 high-k dielectric films, ion implantation of N-2(+), ion implantation of N+, and N2O plasma treatment have been investigated for the new CoTiO3 high-k dielectrics. All three methods reduced the leakage currents and improved the breakdown characteristics but the N2O-plasma treatment produced the best-behaved C-V curves, when compared to the untreated control samples. (c) 2006 The Electrochemical Society. |
URI: | http://hdl.handle.net/11536/11327 http://dx.doi.org/10.1149/1.2388733 |
ISSN: | 0013-4651 |
DOI: | 10.1149/1.2388733 |
期刊: | JOURNAL OF THE ELECTROCHEMICAL SOCIETY |
Volume: | 154 |
Issue: | 1 |
起始頁: | G18 |
結束頁: | G23 |
顯示於類別: | 期刊論文 |