Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jian, Zhi-Cheng | en_US |
dc.contributor.author | Hsieh, Po-Jen | en_US |
dc.contributor.author | Hsieh, Hung-Chih | en_US |
dc.contributor.author | Chen, Huei-Wen | en_US |
dc.contributor.author | Su, Der-Chin | en_US |
dc.date.accessioned | 2014-12-08T15:15:18Z | - |
dc.date.available | 2014-12-08T15:15:18Z | - |
dc.date.issued | 2006-12-01 | en_US |
dc.identifier.issn | 0030-4018 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.optcom.2006.07.009 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/11482 | - |
dc.description.abstract | Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. The p-polarized light is incident on the boundary between a right-angle prism and a tested material. When the total internal reflection occurs at the boundary, and the p-polarized light has a phase variation. It depends on the refractive index of the tested material. Firstly, the two-dimensional phase variation distribution of the p-polarized light at the boundary is measured by the four-step phase shifting interferometric technique. Then, substituting the data into the special equations derived from Fresnel equations, the two-dimensional refractive index distribution of the tested material can be obtained. (c) 2006 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | total internal reflection | en_US |
dc.subject | phase-shifting interferometry | en_US |
dc.subject | Fresnel equations | en_US |
dc.subject | two-dimensional refractive index distribution | en_US |
dc.title | A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.optcom.2006.07.009 | en_US |
dc.identifier.journal | OPTICS COMMUNICATIONS | en_US |
dc.citation.volume | 268 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.spage | 23 | en_US |
dc.citation.epage | 26 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000242269000004 | - |
dc.citation.woscount | 4 | - |
Appears in Collections: | Articles |
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