標題: | A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry |
作者: | Jian, Zhi-Cheng Hsieh, Po-Jen Hsieh, Hung-Chih Chen, Huei-Wen Su, Der-Chin 光電工程學系 Department of Photonics |
關鍵字: | total internal reflection;phase-shifting interferometry;Fresnel equations;two-dimensional refractive index distribution |
公開日期: | 1-Dec-2006 |
摘要: | Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. The p-polarized light is incident on the boundary between a right-angle prism and a tested material. When the total internal reflection occurs at the boundary, and the p-polarized light has a phase variation. It depends on the refractive index of the tested material. Firstly, the two-dimensional phase variation distribution of the p-polarized light at the boundary is measured by the four-step phase shifting interferometric technique. Then, substituting the data into the special equations derived from Fresnel equations, the two-dimensional refractive index distribution of the tested material can be obtained. (c) 2006 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.optcom.2006.07.009 http://hdl.handle.net/11536/11482 |
ISSN: | 0030-4018 |
DOI: | 10.1016/j.optcom.2006.07.009 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 268 |
Issue: | 1 |
起始頁: | 23 |
結束頁: | 26 |
Appears in Collections: | Articles |
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