標題: Application of an ordinal optimization algorithm to the wafer testing process
作者: Lin, Shin-Yeu
Horng, Shih-Cheng
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: genetic algorithm (GA);neural network;ordinal optimization (OO);overkill;retest;stochastic optimization;wafer probing
公開日期: 1-十一月-2006
摘要: In this correspondence, we have formulated a stochastic optimization problem to find the optimal threshold values to reduce the overkills of dies under a tolerable retest level in wafer testing process. The problem is a hard optimization problem with a huge solution space. We propose an ordinal optimization theory-based two-level algorithm to solve for a vector of good enough threshold values and compare with those obtained by others using a set of 521 real test wafers. The test results confirm the feature of controlling the retest level in our formulation, and the pairs of overkills and retests resulted from our approach are almost Pareto optimal. In addition, our approach spends only 6.05 min in total in a Pentium IV personal computer to obtain the good enough threshold values.
URI: http://dx.doi.org/10.1109/TSMCA.2006.878965
http://hdl.handle.net/11536/11596
ISSN: 1083-4427
DOI: 10.1109/TSMCA.2006.878965
期刊: IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANS
Volume: 36
Issue: 6
起始頁: 1229
結束頁: 1234
顯示於類別:期刊論文


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