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dc.contributor.authorLiang, Zhi-Haoen_US
dc.contributor.authorCheng, Yu-Tingen_US
dc.contributor.authorHsu, Wensyangen_US
dc.contributor.authorLee, Yuh-Wenen_US
dc.date.accessioned2014-12-08T15:16:08Z-
dc.date.available2014-12-08T15:16:08Z-
dc.date.issued2006-08-01en_US
dc.identifier.issn1521-3323en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TADVP.2006.875092en_US
dc.identifier.urihttp://hdl.handle.net/11536/11965-
dc.description.abstractIn order to simplify the processing complexity and cut down the manufacturing cost, a new wafer bonding technique using ultraviolet (UV) curable adhesive is introduced here for microelectromechanical systems (MEMS) device packaging and manufacturing applications. UV curable adhesive is cured through UV light exposure without any heating process that is suitable for the packaging of temperature-sensitive materials or devices. A Pyrex 7740 glass is chemically wet etched to form microcavities and utilized as the protection cap substrate. After a UV-curable adhesive is spin-coated onto the glass substrate, the substrate is then aligned and bonded through UV light exposure with a device substrate below. Electrical contact pad opening and die separation are done simultaneously by dicing. Two different testing devices, a dew point sensor and capacitive accelerometer, are built to evaluate the package strength and hermeticity. After the dicing process, no structural damage or stiction phenomenon is found in the packaged parallel capacitor. The acceleration test results also indicate that the package using the Loctite 3491 UV adhesive with 150 mu m bond width can survive more than 300 days at a 25 degrees C and 100% relative humidity working environment.en_US
dc.language.isoen_USen_US
dc.subjectacceleration testsen_US
dc.subjectdriven-out spin methoden_US
dc.subjecthermetic encapsulationen_US
dc.subjectlow-temperature wafer bondingen_US
dc.subjectmicroelectromechanical systems (MEMS) manufacturingen_US
dc.subjectpost-processen_US
dc.subjectultraviolet (UV) adhesiveen_US
dc.subjectwafer-level packagingen_US
dc.titleA wafer-level hermetic encapsulation for MEMS manufacture applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TADVP.2006.875092en_US
dc.identifier.journalIEEE TRANSACTIONS ON ADVANCED PACKAGINGen_US
dc.citation.volume29en_US
dc.citation.issue3en_US
dc.citation.spage513en_US
dc.citation.epage519en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000239707900017-
dc.citation.woscount11-
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