标题: | Improved luminance intensity of InGaN-GaN light-emitting diode by roughening both the p-GaN surface and the undoped-GaN surface |
作者: | Peng, Wei Chih Wu, Yew Chung Sermon 材料科学与工程学系 Department of Materials Science and Engineering |
公开日期: | 24-七月-2006 |
摘要: | The InGaN-GaN epitaxial films were grown by low-pressure metal-organic chemical vapor deposition on a sapphire substrate, and then the light-emitting diode (LED) with double roughened (p-GaN and undoped-GaN) surfaces was fabricated by surface-roughening, wafer-bonding, and laser lift-off technologies. It was found that the front side luminance intensity of double roughened LED was 2.77 times higher than that of the conventional LED at an injection current of 20 mA. The backside luminance intensity was 2.37 times higher than that of the conventional LED. This is because the double roughened surfaces can provide photons multiple chances to escape from the LED surface, and redirect photons, which were originally emitted out of the escape cone, back into the escape cone. |
URI: | http://dx.doi.org/10.1063/1.2236462 http://hdl.handle.net/11536/12015 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.2236462 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 89 |
Issue: | 4 |
结束页: | |
显示于类别: | Articles |
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