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dc.contributor.authorWang, Chun-Kaien_US
dc.contributor.authorChang, Yeh-Chien_US
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorChin, Ching-Yuen_US
dc.date.accessioned2015-07-21T11:21:03Z-
dc.date.available2015-07-21T11:21:03Z-
dc.date.issued2014-11-01en_US
dc.identifier.issn1084-4309en_US
dc.identifier.urihttp://dx.doi.org/10.1145/2651401en_US
dc.identifier.urihttp://hdl.handle.net/11536/123925-
dc.description.abstractThis work tackles a problem of clock power minimization within a skew constraint under supply voltage variation. This problem is defined in the ISPD 2010 benchmark. Unlike mesh and cross link that reduce clock skew uncertainty by multiple driving paths, our focus is on controlling skew uncertainty in the structure of the tree. We observe that slow slew amplifies supply voltage variation, which induces larger path delay variation and skew uncertainty. To obtain the optimality, we formulate a symmetric clock tree synthesis as a mathematical programming problem in which the slew effect is considered by an NLDM-like cell delay variation model. A symmetry-to-asymmetry tree transformation is proposed to further reduce wire loading. Experimental results show that the proposed four methods save up to 20% of clock tree capacitance loading. Beyond controlling slew to suppress supply-voltage-variation-induced skew, we also discuss the strategies of clock tree synthesis under variant variation scenarios and the limitations of the ISPD 2010 benchmark.en_US
dc.language.isoen_USen_US
dc.subjectAlgorithmsen_US
dc.subjectDesignen_US
dc.subjectClock tree optimizationen_US
dc.subjectslewen_US
dc.subjectvoltage variationen_US
dc.subjectrobust designen_US
dc.titleClock Tree Synthesis Considering Slew Effect on Supply Voltage Variationen_US
dc.typeArticleen_US
dc.identifier.doi10.1145/2651401en_US
dc.identifier.journalACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMSen_US
dc.citation.volume20en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000345523400003en_US
dc.citation.woscount0en_US
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