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dc.contributor.authorWang, CYen_US
dc.contributor.authorWu, JTen_US
dc.date.accessioned2014-12-08T15:16:53Z-
dc.date.available2014-12-08T15:16:53Z-
dc.date.issued2006-04-01en_US
dc.identifier.issn1057-7130en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSII.2005.861887en_US
dc.identifier.urihttp://hdl.handle.net/11536/12403-
dc.description.abstractThis paper presents a background timing-skew calibration technique for time-interleaved analog-to-digital converters (ADCs). The timing skew between any two adjacent analog-digital (AID) channels is detected by counting the number of zero crossings of the ADCs input while randomly alternating their sampling sequence. Digitally controlled delay units are adjusted to minimize the timing skews among the AID channels caused by the mismatches among the clock routes. The calibration behaviors, including converging speed and timing jitter, are theoretically analyzed and verified with simulations. A 6-bit 16-channel ADC is used as an example.en_US
dc.language.isoen_USen_US
dc.subjectanalog-digital (A/D) conversionen_US
dc.subjectcalibrationen_US
dc.subjecttimingen_US
dc.titleA background timing-skew calibration technique for time-interleaved analog-to-digital convertersen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSII.2005.861887en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSen_US
dc.citation.volume53en_US
dc.citation.issue4en_US
dc.citation.spage299en_US
dc.citation.epage303en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000236891400012-
dc.citation.woscount21-
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