Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs" - Author's reply

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DC Field	Value	Language
dc.contributor.author	Cho, MH	en_US
dc.date.accessioned	2014-12-08T15:17:18Z	-
dc.date.available	2014-12-08T15:17:18Z	-
dc.date.issued	2006-03-01	en_US
dc.identifier.issn	0018-9480	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/TMTT.2006.869699	en_US
dc.identifier.uri	http://hdl.handle.net/11536/12581	-
dc.language.iso	en_US	en_US
dc.title	Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs" - Author's reply	en_US
dc.type	Letter	en_US
dc.identifier.doi	10.1109/TMTT.2006.869699	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES	en_US
dc.citation.volume	54	en_US
dc.citation.issue	3	en_US
dc.citation.spage	1296	en_US
dc.citation.epage	1297	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000236081500039	-
dc.citation.woscount	0	-
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