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dc.contributor.authorCho, MHen_US
dc.date.accessioned2014-12-08T15:17:18Z-
dc.date.available2014-12-08T15:17:18Z-
dc.date.issued2006-03-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2006.869699en_US
dc.identifier.urihttp://hdl.handle.net/11536/12581-
dc.language.isoen_USen_US
dc.titleComments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs" - Author's replyen_US
dc.typeLetteren_US
dc.identifier.doi10.1109/TMTT.2006.869699en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume54en_US
dc.citation.issue3en_US
dc.citation.spage1296en_US
dc.citation.epage1297en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000236081500039-
dc.citation.woscount0-
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