| 標題: | Anisotropic Structure Induced Electrical Properties of A-plane InN |
| 作者: | Chang, P. -H. Chia, J. -W. Gwo, S. Ahn, H. 物理研究所 光電工程學系 Institute of Physics Department of Photonics |
| 公開日期: | 1-Jan-2013 |
| 摘要: | Terahertz spectroscopy reveals that the anisotropic electrical properties of nonpolar InN film along in-plane c-axis and in-plane m-axis are determined by the orientation of narrow and thin stacking faults, not by the density of defects. |
| URI: | http://hdl.handle.net/11536/128488 |
| ISBN: | 978-1-55752-973-2 |
| ISSN: | 2160-9020 |
| 期刊: | 2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) |
| Appears in Collections: | Conferences Paper |

