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dc.contributor.authorZhao, Liangen_US
dc.contributor.authorChen, Hong-Yuen_US
dc.contributor.authorWu, Shih-Chiehen_US
dc.contributor.authorJiang, Zizhenen_US
dc.contributor.authorYu, Shimengen_US
dc.contributor.authorHou, Tuo-Hungen_US
dc.contributor.authorWong, H. -S Philipen_US
dc.contributor.authorNishi, Yoshioen_US
dc.date.accessioned2015-12-02T03:00:54Z-
dc.date.available2015-12-02T03:00:54Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-4799-2217-8en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/128534-
dc.description.abstractMulti-level cell (MLC) capability in RRAM is attractive for reducing the cost per bit. Based on the filamentary switching mechanisms, we propose a pulse-train programming scheme to achieve reliable and uniform MLC controls without the need of any read-verification operation. By applying the novel scheme to a 3 bit/cell RRAM device, the uniformity of resistance distribution can be improved up to 80%.en_US
dc.language.isoen_USen_US
dc.titleImproved Multi-level Control of RRAM Using Pulse-Train Programmingen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF TECHNICAL PROGRAM - 2014 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000358865800034en_US
dc.citation.woscount0en_US
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