| 標題: | 平面及鰭狀場效電晶體高階奈米缺陷統計物理模式：隨機電報雜訊和偏壓溫度不穩度 Advanced Nanoscale Defect Statistical Model for Random Telegraph Signals and Bias and Temperature Instabilities in Planar Mosfets and FinFETs |
| 作者: | 陳明哲 CHEN MING-JER 國立交通大學電子工程學系及電子研究所 |
| 公開日期: | 2016 |
| 官方說明文件#: | MOST104-2221-E009-058-MY3 |
| URI: | http://hdl.handle.net/11536/130900 https://www.grb.gov.tw/search/planDetail?id=11715770&docId=478043 |
| Appears in Collections: | Research Plans |
