完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | He, Jinping | en_US |
dc.contributor.author | Wang, Nan | en_US |
dc.contributor.author | Kobayashi, Takayoshi | en_US |
dc.date.accessioned | 2017-04-21T06:56:17Z | - |
dc.date.available | 2017-04-21T06:56:17Z | - |
dc.date.issued | 2016-12 | en_US |
dc.identifier.issn | 2040-8978 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1088/2040-8978/18/12/125303 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/132777 | - |
dc.description.abstract | The resolving power of optical microscopy involving two or even more beams, such as pump-probe microscopy and nonlinear optical microscopy, can be enhanced both laterally and longitudinally with partly staggered beams. A numerical study of the new super-resolution imaging technology is performed with vector diffraction theory. The influence of polarization is discussed. A resolving power of sub-100 nm and sub-300 nm in the lateral and longitudinal directions, respectively, is achievable. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | microscopy | en_US |
dc.subject | super-resolution | en_US |
dc.subject | partly staggered beams | en_US |
dc.subject | vector diffraction theory | en_US |
dc.title | Numerical study of super-resolved optical microscopy with partly staggered beams | en_US |
dc.identifier.doi | 10.1088/2040-8978/18/12/125303 | en_US |
dc.identifier.journal | Journal of Optics | en_US |
dc.citation.volume | 18 | en_US |
dc.citation.issue | 12 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000389335000001 | en_US |
顯示於類別: | 期刊論文 |