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dc.contributor.authorHe, Jinpingen_US
dc.contributor.authorWang, Nanen_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.date.accessioned2017-04-21T06:56:17Z-
dc.date.available2017-04-21T06:56:17Z-
dc.date.issued2016-12en_US
dc.identifier.issn2040-8978en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2040-8978/18/12/125303en_US
dc.identifier.urihttp://hdl.handle.net/11536/132777-
dc.description.abstractThe resolving power of optical microscopy involving two or even more beams, such as pump-probe microscopy and nonlinear optical microscopy, can be enhanced both laterally and longitudinally with partly staggered beams. A numerical study of the new super-resolution imaging technology is performed with vector diffraction theory. The influence of polarization is discussed. A resolving power of sub-100 nm and sub-300 nm in the lateral and longitudinal directions, respectively, is achievable.en_US
dc.language.isoen_USen_US
dc.subjectmicroscopyen_US
dc.subjectsuper-resolutionen_US
dc.subjectpartly staggered beamsen_US
dc.subjectvector diffraction theoryen_US
dc.titleNumerical study of super-resolved optical microscopy with partly staggered beamsen_US
dc.identifier.doi10.1088/2040-8978/18/12/125303en_US
dc.identifier.journalJournal of Opticsen_US
dc.citation.volume18en_US
dc.citation.issue12en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000389335000001en_US
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